FIS4-Near-Infrared
Four-wave Interferometric Sensor
Near-infrared spectrum (900nm~1200nm)
Super high resolution of 262144 phase points
Large dynamic range up to 240μm
Ultra-high resolution of 512×512 (262144) phase points to achieve high-precision wavefront measurement in the 900nm to 1200nm band, which can be used for optical system aberration measurement, optical system calibration, material internal lattice distribution measurement, metasurface, hyperlens wavefront measurement, etc.
FIS4 NIR combines the patented technology of random coded four-wave diffraction with the infrared camera to interfere at the position of the rear image plane, and has low requirements for the coherence of the light source without phase shifting. Ordinary imaging systems can realize interference measurement, with ultra-high vibration resistance and ultra-high stability, and can achieve NM-level precision measurement without vibration isolation.
◆ Single light interference, no reference light
◆ Wide spectrum 900nm~1200nm band
◆ 2nm RMS high phase resolution
◆ Large dynamic range up to 240μm
◆ Strong vibration resistance, no optical vibration isolation
◆ Like imaging, simple and fast light path construction
◆ Support collimation beam, large NA convergence beam
|
Wavelength range |
900nm~1200nm |
|
Target size |
10mm×10mm |
|
Spatial resolution |
26μm |
|
Sampling resolution |
512×512(262144pixel) |
|
Phase resolution |
<2nmRMS |
|
Absolute accuracy |
15nmRMS |
|
Dynamic range |
240μm(256λ) |
|
Sampling rate |
32fps |
|
Real-time processing speed |
10Hz(Full resolution) |
|
Interface type |
USB3.0 |
|
dimension |
70mm×46.5mm×68.5mm |
|
weigh |
about 240g |
